@article{Holloway_2017,<br/><span class="tab"></span> title={Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor},<br/><span class="tab"></span> volume={121},<br/><span class="tab"></span> ISSN={1089-7550},<br/><span class="tab"></span> url={http://dx.doi.org/10.1063/1.4984201},<br/><span class="tab"></span> DOI={10.1063/1.4984201},<br/><span class="tab"></span> number={23},<br/><span class="tab"></span> journal={Journal of Applied Physics},<br/><span class="tab"></span> publisher={AIP Publishing},<br/><span class="tab"></span> author={Holloway,<br/><span class="tab"></span> Christopher L. and Simons,<br/><span class="tab"></span> Matt T. and Gordon,<br/><span class="tab"></span> Joshua A. and Dienstfrey,<br/><span class="tab"></span> Andrew and Anderson,<br/><span class="tab"></span> David A. and Raithel,<br/><span class="tab"></span> Georg},<br/><span class="tab"></span> year={2017},<br/><span class="tab"></span> month=jun }